Abstract

Metric-based few-shot fine-grained image classification (FSFGIC) aims to learn a transferable feature embedding network by estimating the similarities between query images and support classes from very few examples. In this work, we propose, for the first time, to introduce the non-linear data projection concept into the design of FSFGIC architecture in order to address the limited sample problem in few-shot learning and at the same time to increase the discriminability of the model for fine-grained image classification. Specifically, we first design a feature re-abstraction embedding network that has the ability to not only obtain the required semantic features for effective metric learning but also re-enhance such features with finer details from input images. Then the descriptors of the query images and the support classes are projected into different non-linear spaces in our proposed similarity metric learning network to learn discriminative projection factors. This design can effe

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