Finding Significant Features For Few-shot Learning Using Dimensionality Reduction
2021 Β· Mauricio Mendez-Ruiz, Ivan Garcia Jorge Gonzalez-Zapata, Gilberto Ochoa-Ruiz, et al.
Abstract
Few-shot learning is a relatively new technique that specializes in problems where we have little amounts of data. The goal of these methods is to classify categories that have not been seen before with just a handful of samples. Recent approaches, such as metric learning, adopt the meta-learning strategy in which we have episodic tasks conformed by support (training) data and query (test) data. Metric learning methods have demonstrated that simple models can achieve good performance by learning a similarity function to compare the support and the query data. However, the feature space learned by a given metric learning approach may not exploit the information given by a specific few-shot task. In this work, we explore the use of dimension reduction techniques as a way to find task-significant features helping to make better predictions. We measure the performance of the reduced features by assigning a score based on the intra-class and inter-class distance, and selecting a feature red
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