Revisiting Metric Learning For Few-shot Image Classification

Abstract

The goal of few-shot learning is to recognize new visual concepts with just a few amount of labeled samples in each class. Recent effective metric-based few-shot approaches employ neural networks to learn a feature similarity comparison between query and support examples. However, the importance of feature embedding, i.e., exploring the relationship among training samples, is neglected. In this work, we present a simple yet powerful baseline for few-shot classification by emphasizing the importance of feature embedding. Specifically, we revisit the classical triplet network from deep metric learning, and extend it into a deep K-tuplet network for few-shot learning, utilizing the relationship among the input samples to learn a general representation learning via episode-training. Once trained, our network is able to extract discriminative features for unseen novel categories and can be seamlessly incorporated with a non-linear distance metric function to facilitate the few-shot classifi

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• arxiv keyli2019revisiting

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