Realizing quantum information processors is challenged by errors and noise across all platforms. While composite segmentation schemes have been proposed in many systems, their application to photonic quantum gates in dual-rail configurations has only recently been demonstrated. However, prior research has been limited to a small number of segments, full noise correlation, and has overlooked the inherent power loss in such designs. Here, we study the fidelity and power loss of composite designs for photonic quantum gates with a high number of segments of varying geometrical widths. Using numerical simulations, we analyze the relationship between gate performance and the number of waveguide segments, accounting for statistical error correlations and variances. Beyond effectively reducing the errors, an asymptotic scaling pattern of quantum gate fidelity and power loss is observed as the number of segments increases. This analysis is examined in Silicon and Lithium Niobate platforms, addressing practical implementation challenges. Our findings demonstrate that optimized multi-segment waveguide geometrical designs significantly enhance the robustness and efficiency of photonic quantum gates, paving the way for more reliable quantum information processors.