Abstract
The existence of noisy labels in real-world data negatively impacts the performance of deep learning models. Although much research effort has been devoted to improving the robustness towards noisy labels in classification tasks, the problem of noisy labels in deep metric learning (DML) remains under-explored. Existing noisy label learning methods designed for DML mainly discard suspicious noisy samples, resulting in a waste of the training data. To address this issue, we propose a noise-robust DML framework with SubGroup-based Positive-pair Selection (SGPS), which constructs reliable positive pairs for noisy samples to enhance the sample utilization. Specifically, SGPS first effectively identifies clean and noisy samples by a probability-based clean sample selectionstrategy. To further utilize the remaining noisy samples, we discover their potential similar samples based on the subgroup information given by a subgroup generation module and then aggregate them into informative positive