Deep Metric Learning Assisted By Intra-variance In A Semi-supervised View Of Learning
2023 Β· Liu Pingping, Liu Zetong, Lang Yijun, et al.
Abstract
Deep metric learning aims to construct an embedding space where samples of the same class are close to each other, while samples of different classes are far away from each other. Most existing deep metric learning methods attempt to maximize the difference of inter-class features. And semantic related information is obtained by increasing the distance between samples of different classes in the embedding space. However, compressing all positive samples together while creating large margins between different classes unconsciously destroys the local structure between similar samples. Ignoring the intra-class variance contained in the local structure between similar samples, the embedding space obtained from training receives lower generalizability over unseen classes, which would lead to the network overfitting the training set and crashing on the test set. To address these considerations, this paper designs a self-supervised generative assisted ranking framework that provides a semi-su
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